High accuracy ultraviolet index of refraction measurements using a Fourier transform spectrometer
نویسندگان
چکیده
منابع مشابه
High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
We have constructed a new facility at the National Institute of Standards and Technology (NIST) to measure the index of refraction of transmissive materials in the wavelength range from the visible to the vacuum ultraviolet. An etalon of the material is illuminated with synchrotron radiation, and the interference fringes in the transmittance spectrum are measured using a Fourier transform spect...
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ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 2003
ISSN: 1044-677X
DOI: 10.6028/jres.108.037